Optimization of Accurate SEM Imaging by Use of Artificial ImagesCIZMAR, Petr; VLADAR, András E; POSTEK, Michael T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737815.1-737815.6Conference Paper

Metrology at the Nanoscale : What are the Grand Challenges?LYONS, Kevin W; POSTEK, Michael T.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7042, pp 704202.1-704202.13, issn 0277-786X, isbn 978-0-8194-7262-5 0-8194-7262-X, 1VolConference Paper

Instrumentation, Metrology, and Standards : Key Elements for the Future of NanomanufacturingPOSTEK, Michael T; LYONS, Kevin.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 664802.1-664802.7, issn 0277-786X, isbn 978-0-8194-6796-6, 1VolConference Paper

Advanced Image Composition with Intra-Frame Drift CorrectionCIZMAR, Petr; VLADAR, Andras E; POSTEK, Michael T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036, issn 0277-786X, isbn 978-0-8194-8610-3, 80360D.1-80360D.5Conference Paper

Recent Progress in Understanding the Imaging and Metrology using the Helium Ion MicroscopePOSTEK, Michael T; VLADAR, Andras E; BIN MING et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737808.1-737808.10Conference Paper

The challenge of nanometrologyPOSTEK, Michael T.SPIE proceedings series. 2002, pp 84-96, isbn 0-8194-4347-6, 13 p.Conference Paper

Nanometer-Scale metrology: Meeting the nanotechnology measurement challengesPOSTEK, Michael T.SPIE proceedings series. 2002, pp 102-111, isbn 0-8194-4347-6, 10 p.Conference Paper

Advances in Modeling of Scanning Charged-Particle-Microscopy ImagesCIZMAR, Petr; VLADAR, András E; POSTEK, Michael T et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77290Z.1-77290Z.9Conference Paper

Notes from the nist/nrl/spie workshop on nanostructure science, metrology & technology: Microelectronics groupSPIE proceedings series. 2002, pp 147-150, isbn 0-8194-4347-6, 4 p.Conference Paper

Report out of the military sciences working groupSPIE proceedings series. 2002, pp 37-42, isbn 0-8194-4347-6, 6 p.Conference Paper

Application Possibilities of Several Modern Methods of Microscopy and Microanalysis in Forensic Science FieldKOTRLY, Marek; TURKOVA, Ivana.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036, issn 0277-786X, isbn 978-0-8194-8610-3, 803608.1-803608.6Conference Paper

Nanostructure science, metrology, and technology (Gaithersburg, 5-7 December 2002)Peckerar, Martin C; Postek, Michael T.SPIE proceedings series. 2002, isbn 0-8194-4347-6, X, 278 p, isbn 0-8194-4347-6Conference Proceedings

Pushing the Envelope with SEM/SDD-EDS Mapping: X-ray Spectrum Image Mapping in 30 Seconds or Less, But What Are the Real Limits?NEWBURY, Dale.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77290F.1-77290F.9Conference Paper

Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosionCROSTA, Giovanni F.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036, issn 0277-786X, isbn 978-0-8194-8610-3, 80360H.1-80360H.10Conference Paper

Scanning microscopy 2009 (4-7 May 2009, Monterey, California, United States)Postek, Michael T.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, various pagings, isbn 978-0-8194-7654-8 0-8194-7654-4Conference Proceedings

Instrumentation, metrology, and standards for nanomanufacturing (29-30 August 2007, San Diego, California, USA)Postek, Michael T; Allgair, John.Proceedings of SPIE, the International Society for Optical Engineering. 2007, issn 0277-786X, isbn 978-0-8194-6796-6, 1Vol, various pagings, isbn 978-0-8194-6796-6Conference Proceedings

A Decade of Commitment from the NIST Manufacturing Engineering Laboratory to Nanomanufacturing and NanometrologyLYONS, Kevin W; POSTEK, Michael T.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7405, issn 0277-786X, isbn 978-0-8194-7695-1 0-8194-7695-1, 1Vol, 740503.1-740503.18Conference Paper

Instrumentation, metrology, and standards for nanomanufacturing III (3-5 August 2009, San Diego, California, United States)Postek, Michael T; Allgair, John Alexander.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7405, issn 0277-786X, isbn 978-0-8194-7695-1 0-8194-7695-1, 1Vol, various pagings, isbn 978-0-8194-7695-1 0-8194-7695-1Conference Proceedings

Automated nanoscale AFM measurements using a-priori-knowledgeRECKNAGEL, C; ROTHE, H.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781A.1-73781A.9Conference Paper

SEM-EDX analysis of an unknown known white powder found in a shipping container from PeruALBRIGHT, Douglas C.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73782H.1-73782H.11Conference Paper

Nanometer science and technology (viewgraphs only) [4608-05]MURDAY, J.SPIE proceedings series. 2002, pp 52-83, isbn 0-8194-4347-6, 32 p.Conference Paper

Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFMKORPELAINEN, V; SEPPA, J; LASSILA, A et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036, issn 0277-786X, isbn 978-0-8194-8610-3, 80360Q.1-80360Q.9Conference Paper

NEW PROSPECTS FOR ELECTRON BEAMS AS TOOLS FOR SEMICONDUCTOR LITHOGRAPHYPFEIFFER, Hans C.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737802.1-737802.12Conference Paper

Revivals of Molecular Nonlinear Optics in Physics, Chemistry and Life SciencesZYSS, Joseph.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7042, pp 704002.1-704002.15, issn 0277-786X, isbn 978-0-8194-7262-5 0-8194-7262-X, 1VolConference Paper

Biology and nanoscience summary of discussions of the biology and nanoscience panel of the SPIE workshop on nanotechnologyLEBRUN, T.SPIE proceedings series. 2002, pp 230-233, isbn 0-8194-4347-6, 4 p.Conference Paper